Electron-microscope study of the effect of chlorhexidine on Pseudomonas aeruginosa.
Microbios, 1979;26(104):85-93.
PMID: 121759
Abstract
Electron micrographs of cytological damage to log phase Pseudomonas aeruginosa caused by low consentrations of chlorhexidine indicate an action primarily on the cytoplasmic membrane at concentration of 2.0--3.0 micrograms/ml chlorhexidine, and on the cytoplasmic membrane plus layers external to it at concentrations greater than 3.0 micrograms/ml. Evidence of two types of resistance to chlorhexidine is presented.
MeSH terms
More resources
EndNote: Download